Jan 28 - 2007
Art-Test Invited to International Conference on Electronic Imaging

During the International Conference on Electronic Imaging, 28 January – 1 February, San Josè, California, USA, Art-Test has been invited to present the paper “Active and passive sensors for art works analysis and investigations”, in the “Videometrics” session.

http://electronicimaging.org/program/07/conferences/
index.cfm?fuseaction=6491